This post is part of a longer-running series about giving users a tangible reason to trust their hardware through my IRIS (Infra-Red, in-situ) technique for the non-destructive inspection of chips. Previously, I discussed the focus stage, light source, and methodology used to develop IRIS. In my post about designing the light source for IRIS, I covered the electronic design, and noted that an important conclusion of the electronic design exploration was the need for a continuously variable, 2-ax...